Image: AFMsetup

Description: Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
Title: AFMsetup
Credit: http://kristian.molhave.dk This illustration was made for the Opensource Handbook of Nanoscience and Nanotechnology The image also appears on the Commons/nanotechnology page
Author: yashvant
Permission: CC-BY-2.5, please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration!
Usage Terms: Creative Commons Attribution 2.5
License: CC BY 2.5
License Link: http://creativecommons.org/licenses/by/2.5
Attribution Required?: Yes